גלאי חלקיקים אלקטרונים עם אנרגיה גבוהה | retractable BSE detector for SEM

גלאי חלקיקים אלקטרונים עם אנרגיה גבוהה | retractable BSE detector for SEM

גלאי חלקיקים אלקטרונים עם אנרגיה גבוהה | retractable BSE detector for SEM
גלאי חלקיקים אלקטרונים עם אנרגיה גבוהה | retractable BSE detector for SEM

מדובר בגלאי אלקטרונים נשלף עבור מיקרוסקופיה של אלקטרונים. הגלאי משלב את הגביש הטוב ביותר עבור סינטילציה עם מכניקה בדיוק גבוה

Single crystal sensor
Scintillator/PMT principle for ultimate image quality
Excellent S/N ratio
Unlimited sensor lifetime
HV + LV + ESEM operation

אתם מוזמנים לפנות אלינו לגבי כל גלאי ומוצרים נילווים אותם אתם מחפשים

צרו עמנו קשר לקבלת ייעוץ, פרטים נוספים והצעת מחיר

התקשרו עוד היום

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Here are 10 similar, highly sought-after detectors for SEM and related techniques:

  1. Everhart-Thornley (ET) Detector: This is the most common type of secondary electron (SE) detector. It’s in top demand because it provides high-resolution, high-contrast images of a sample’s surface topography, which is crucial for most SEM applications.

  2. In-lens Detectors: These detectors are integrated into the SEM’s electron column, directly above the sample. By collecting low-energy secondary electrons and high-angle backscattered electrons, they offer superior resolution and signal-to-noise ratio, making them a premium choice for high-end applications.

  3. Energy-Dispersive X-ray Spectroscopy (EDS) Detectors: While not an electron detector, an EDS system is a vital add-on for most modern SEMs. It detects characteristic X-rays emitted from the sample to provide a full elemental analysis, allowing for compositional mapping and identification.

  4. Electron Backscatter Diffraction (EBSD) Detectors: An EBSD detector collects diffracted electrons from a crystalline sample to determine crystallographic orientation, grain size, and texture. This is a must-have for materials science and geology research.

  5. Cathodoluminescence (CL) Detectors: A CL detector measures the light (photons) emitted from a sample when it’s excited by the electron beam. This is a specialized, in-demand detector for studying the optical and electronic properties of semiconductors, minerals, and phosphors.

  6. Scanning Transmission Electron Microscopy (STEM) Detectors: Some advanced SEMs can be configured to operate in STEM mode for very thin samples. The STEM detector is placed below the sample to collect transmitted electrons, enabling high-resolution imaging and analysis similar to a dedicated TEM.

  7. Annular Bright-Field (BF) and Annular Dark-Field (ADF) Detectors: These detectors are used in STEM mode. The BF detector collects the transmitted, unscattered electrons to create an image, while the ADF detector collects electrons scattered at high angles, providing Z-contrast images where heavier elements appear brighter.

  8. Retarding Field Detectors (RFDs): Used for low-voltage and low-vacuum SEM, RFDs can filter electrons based on their energy. This is useful for imaging non-conductive samples without needing a conductive coating, which is a major advantage for biological and polymer science.

  9. Quad-BSE Detectors: A more advanced version of a standard BSE detector, these detectors are segmented into four quadrants. This allows for not only compositional information but also topographical data by comparing the signals from opposing quadrants, and can even be used for 3D reconstruction.

  10. Cryogenic SEM (Cryo-SEM) Detectors and Systems: Not a single detector but a system, Cryo-SEM allows for imaging of frozen, hydrated biological samples. The entire system is in high demand for preserving soft matter and biological structures in their near-native state.

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, גלאי סינטילטור, גלאי סינטלטור

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